In this two-day workshop, you will learn how use TetraMAX?--Synopsys' ATPG Tool for SOC design--to perform the following tasks:
- Generate test patterns for stuck-at faults given a scan gate-level design created by DFT Compiler or other tools
- Describe the test protocol and test pattern timing using STIL
- Debug DRC and stuck-at fault coverage problems using the Graphical Schematic Viewer
- Troubleshoot fault coverage problems
- Save and validate test patterns
- Troubleshoot simulation failures
This class includes an overview of the fundamentals of manufacturing test, such as:
- What is manufacturing test?
- Why perform manufacturing test?
- What is a stuck-at fault?
- What is a scan chain?
This class also includes a brief overview of the DSM Test Failure Diagnosis and Adaptive Scan features in TetraMAX?.
At the end of this workshop the student should be able to:
- Incorporate TetraMAX? ATPG in a design and test methodology that produces desired fault coverage, ATPG vector count and ATPG run-time for a full-scan or almost full-scan design
- Create a STIL Test Protocol File for a design by using QuickSTIL menus or commands, DFT Compiler or from scratch
- Use the Graphical Schematic Viewer to analyze and debug warning messages from Design Rule Check or fault coverage problems after ATPG
- Customize a Test Protocol for a design that requires special circuit initialization, scan shift or capture procedures or pattern timing
- Describe when and how to use at least four options to increase test coverage and/or decrease the number of required test patterns
- Save test patterns in a proper format for simulation and transfer to an ATE
- Validate test patterns using STIL Direct Pattern Validation
ASIC, SoC or Test Engineers who perform ATPG at the Chip or SoC level.
To benefit the most from the material presented in this workshop, students should: Have taken the DFT Compiler 1 workshop or possess equivalent knowledge with DFT Compiler and fundamentals of manufacturing test including:
- Understanding the differences between manufacturing and design verification testing
- Stuck-at fault model
- Internal and boundary scan chains
- Scan shift and capture violations
- Major scan design-for-test rules concerning flip-flops, latches and bi-directional/tri-state drivers
- Tradeoffs between having single or multiple
- Understanding of digital IC logic design
- Working knowledge of Verilog or VHDL language
- Familiarity with UNIX workstations running X-windows
- Familiarity with vi, emacs, or other UNIX text editors
Introduction to ATPG Test
Building ATPG Models
Minimizing ATPG Patterns
Writing ATPG Patterns